Bridger, Paul M.

Article from CaltechAUTHORS

• Hill, C. J. and Bridger, P. M., el al. (1999) Scanning apertureless microscopy below the diffraction limit: Comparisons between theory and experiment; Applied Physics Letters; Vol. 75; No. 25; 4022-4024; 10.1063/1.125525
• Jones, J. T. and Bridger, P. M., el al. (1999) Charge storage in CeO2/Si/CeO2/Si(111) structures by electrostatic force microscopy; Applied Physics Letters; Vol. 75; No. 9; 1326-1328; 10.1063/1.124682
• Bridger, P. M. and Bandić, Z. Z., el al. (1999) Electric force microscopy of induced charges and surface potentials in GaN modified by light and strain; Journal of Vacuum Science and Technology B; Vol. 17; No. 4; 1750-1752; 10.1116/1.590819
• Bridger, P. M. and Bandić, Z. Z., el al. (1999) Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy; Applied Physics Letters; Vol. 74; No. 23; 3522-3524; 10.1063/1.124148
• Piquette, E. C. and Bridger, P. M., el al. (1999) Morphology, polarity, and lateral molecular beam epitaxy growth of GaN on sapphire; Journal of Vacuum Science and Technology B; Vol. 17; No. 3; 1241-1245; 10.1116/1.590730
• Bandić, Z. Z. and Bridger, P. M., el al. (1999) High voltage (450 V) GaN Schottky rectifiers; Applied Physics Letters; Vol. 74; No. 9; 1266-1268; 10.1063/1.123520
• Piquette, E. C. and Bridger, P. M., el al. (1999) Effect of Buffer Layer and III/V Ratio on the Surface Morphology of GaN Grown by MBE; MRS Internet Journal of Nitride Semiconductor Research; Vol. 4S1; Art. No. G3.77
• Bridger, P. M. and Bandić, Z. Z., el al. (1998) Correlation between the surface defect distribution and minority carrier transport properties in GaN; Applied Physics Letters; Vol. 73; No. 23; 3438-3440; 10.1063/1.122790
• Bandić, Z. Z. and Bridger, P. M., el al. (1998) Electron diffusion length and lifetime in p-type GaN; Applied Physics Letters; Vol. 73; No. 22; 3276-3278; 10.1063/1.122743