George, Nicholas A.

Combined from CaltechTHESIS advisor

• MacQuigg, David Rodgers (1975) The Modulated Grating Hologram; 10.7907/VZN5-MT65
• Livanos, Alexander Constantine R. (1975) I. Edge Diffraction of a Convergent Wave. II. Diffraction of Laguerre Gaussian Beams by a Circular Aperture; 10.7907/KDAN-7033
• Melville, Richard Devern Samuels (1975) Spatial and Spectral Behavior of Speckle in an Imaging System; 10.7907/2KP8-CT79
• Jain, Atul (1974) A Wavelength Diversity Technique for Smoothing of Speckle; 10.7907/02VQ-6128
• D'Orazio, Robert Joseph (1973) Detection of Mode-Locked Laser Signals; 10.7907/26D2-8776
• Owyoung, Adelbert (1972) The Origins of the Nonlinear Refractive Indices of Liquids and Glasses; 10.7907/E9HM-AK76
• Menzies, Robert Thomas (1970) Magnetic Field and Pressure Effects in a Saturated Gas Laser Amplifier; 10.7907/3h9r-da77
• Yoh, James (1969) Gas Laser Discharge Noise and its Effect on the Laser Output; 10.7907/ysmv-qp80
• Chang, Milton M.T. (1969) Holographic Dielectric Gratings: Theory and Practice; 10.7907/CWA9-QS54
• McCrickerd, John Thomas (1969) The Holographic Stereogram; 10.7907/gq8t-k869
• Matthews, John Wallace (1967) Theory of Holography; 10.7907/qznw-p178
• Dienes, Andrew (1967) Nonlinear and Anisotropic Effects in Magnetically Tuned Laser Amplifiers; 10.7907/AF03-T980
• Buczek, Carl James (1965) Spontaneously Radiating Atoms in Cavity Fields; 10.7907/CCD3-4P11
• Close, Donald Henry (1965) Nonlinear Effects in Traveling Wave Laser AmpIfiers; 10.7907/Y5FC-GV56
• Asmus, John Fredrich (1965) An Analysis of Perturbed Confocal Resonators; 10.7907/74wn-7319
• Specht, Walter Albert (1965) Part I. Modes in Spherical-Mirror Resonators. Part II. Dominant Mode Calculations in Output-Coupled Infinite Strip Mirror Resonators; 10.7907/P9W2-EX19
• Schwarz, Steven Emanuel (1964) Plasma Diagnosis by Means of Photon-Electron Scattering; 10.7907/7Y36-RP09
• Clark, Peter Osgoode (1964) An Analysis of Multireflector Optical Resonators; 10.7907/M4PW-BM47
• Shumate, Michael Stewart (1964) An Interferometric Measurement of Index of Refraction; 10.7907/RYZC-8410