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Hamill, Gregory P.
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CaltechAUTHORS
Hamill, G. P. and Vreeland, T., Jr. (1979)
Diffracted beam-transmitted beam Borrmann X-ray topography in copper. A novel method of stereo depth topography
; Journal of Applied Crystallography; Vol. 12; No. 4; 346-350;
10.1107/S0021889879012668
Hamill, G. P. and Vreeland, T., Jr. (1978)
Silicon strain gages for cryostatic temperature use
; Materials Science and Engineering; Vol. 32; No. 1; 99;
10.1016/0025-5416(78)90216-1