Iannelli, John M.

Combined from CaltechAUTHORS

• Iannelli, John and Blauvelt, Hank, et el. (1999) Determination of dispersion induced relative intensity noise through spectral linewidth measurements; ISBN 0-7803-5633-0; Nanostructures and quantum dots: 1999 IEEE/LEOS summer topical meeting; 9-10; 10.1109/LEOSST.1999.794728
• Iannelli, John M. and Shevy, Y., et el. (1993) Linewidth reduction and frequency stabilization of semiconductor lasers using dispersive losses in an atomic vapor; IEEE Journal of Quantum Electronics; Vol. 29; No. 5; 1253-1261; 10.1109/3.236139