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Mayer, James W.
Book Chapter from
CaltechAUTHORS
Scherzer, B. M. U. and Børgesen, P., et el. (1976)
Determination of Stopping Cross Sections by Rutherford Backscattering
; ISBN 978-1-4615-8878-8; Ion Beam Surface Layer Analysis; 33-46;
10.1007/978-1-4615-8876-4_4
Gamo, K. and Inada, T., et el. (1976)
Analysis of Ga_(1-x)Al_xAs-GaAs Heteroepitaxial Layers by Proton Backscattering
; ISBN 978-1-4615-8878-8; Ion Beam Surface Layer Analysis; 375-384;
10.1007/978-1-4615-8876-4_32
Mayer, J. W. (1973)
Ion implantation in semiconductors
;
10.1109/IEDM.1973.188633